Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials download pdf
Par reilly carlos le jeudi, février 22 2018, 05:35 - Lien permanent
Otwin Breitenstein,Wilhelm Warta,Martin Langenkamp: Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials
____________________________
Author: Otwin Breitenstein,Wilhelm Warta,Martin Langenkamp
Number of Pages: 258 pages
Published Date: 06 Nov 2012
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Publication Country: Berlin, Germany
Language: English
ISBN: 9783642264788
Download Link: Click Here
____________________________